PLAST-CONTROL: New non-contact capacitive thickness measurement device
New non-contact capacitive thickness measurement device specifically for barrier films. Major issue with EVOH and NYLON resins with standard capacitive technology above 50 degree C causes measurements to be inaccurate and only measures EVOH & PA layers. PLAST-CONTROL\’s new system scans across the double layflat in 20-30 seconds where the film is below 50 C. Requires oscillating haul-off for film movement. After first 6 scans (2-3 minutes) accurate profile is displayed and ready for automatic gauge control correction. There after, every scan displays new profile information. Max. layflat for C-scan is 2.2 meter. Wider O-scan frames in development. Contact Mark Anderson at 978 462-0306 for more information.